Showing results: 496 - 510 of 683 items found.
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FS2601 -
FuturePlus Systems
The FS2601 is one of our newest and fastest logic analyzer probes used to test DDR5 memory. It is designed to work exclusively with 4 Keysight U4164A logic analysis modules operating in either Quad Sample State or Quarter Channel 10GHz timing modes. This gives the user an extremely effective tool for debugging, testing and verifying DDR5 UDIMMs running above 4000MT/s.
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FS2600A -
FuturePlus Systems
The FS2600A is our newest and fastest logic analyzer probe used to test DDR5 RDIMM and LRDIMM memory. It is designed to work exclusively with 4 Keysight U4164A logic analysis modules operating in either Quad Sample State or Quarter Channel 10GHz timing modes. This gives the user an extremely effective tool for debugging, testing and verifying DDR5 RDIMM/LRDIMMs and DDR5 Memory Channels.
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855 -
TEGAM Inc.
The ideal solution for anyone that needs a hand held, multi-purpose calibrator to perform field or lab tests on temperature probes or thermometers. The 855 meter will simulate, source, measure and record the same thermocouple types as the 850, K-J-T-E, and adds N-B-R-S-G-C-D types. The meter also supports 1000, 100k, 100 RTD''s but does not support thermistor''s.
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Medalist i1000 Systems -
Keysight Technologies
Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
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Circuit Check, Inc.
Circuit Check began Strain Gauge Testing in 1999 when BGA/SMT technology started replacing PTH components, reducing strain levels was a reactive post fixture fabrication process. We quickly recognized that the “reactionary” process was neither efficient nor were we capable on knowing the lowest achievable strain levels. Our engineering team came up with visual tools utilized during design to easily identify areas of excessive probe force, though still not enough data was generated to identify the lowest possible strain. Finite Element Analysis software models the PCBA and test fixture and applies the pressures from test probes and board supports and indicates the micro strain level applied to the PCBA. Using the FEA software during our design process allows our engineers to modify fixture designs to attain the lowest possible micro strain before fabrication begins.
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PCI EmbeddedComputer Systems
The 3U power test module is an ideal solution for evaluating heat dissipation in a rugged conduction cooled VPX cage or chassis. This card is a thermal load in the chassis to evaluate the heat dissipation. The chassis can be monitored with temp sensing probes and or FLIR imaging. Different wattages are selected by setting dip switches. The +5 and 3.3V loads are on the top of the module. The +12V and -12V loads are on the bottom side of the module.
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CT Serie -
Test-X Fixture Products
The CT Series Mechanical Kits, utilizing the patented CAM mechanism1, offset the same precision linear motion. The 'Z' axis motion is ideal for a larger point count mechanical test applications.The CT Series features a hinged 3/8" FR4 probe board, tooling holes for precision alignment, removable sides, precision shafts and cam slide block assemblies, and a pan latch assembly.
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1503 -
Fluke Corporation
The Fluke 1503 is a great choice for basic residential and commercial electrical insulation testing. This rugged, compact tool fits in the palm of your hand. The 1503 is the same form factor as the Fluke 1507 but with a few less features. You can count on it to handle the most common tests at a most affordable price. Additional features, like the remote probe, reduce the time needed to perform repetitive testing.
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Spectrum Instrumentation
Adapter Cables connect your Spectrum card or instrument with your device under test, your sensor, your transmitter or receiver, your external machine, your prototype equipment or simply with a probe for measuring. To fulfill a lot of different requirements Spectrum is offering adapter cables between different types of connections and with different length. These adapter cables are manufactured for Spectrum following Spectrum's specification.
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3 Series MDO -
Tektronix, Inc.
With the largest display in class, improved low-level signal measurement accuracy and industry-leading probe performance, the 3 Series MDO sets a new standard for bench oscilloscopes. Whether you’re testing your baseband design for IoT or just for simple EMI sniffing, the 3 Series has a unique true hardware spectrum analyzer built right in with superior RF test performance and guaranteed RF specifications.
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Imapact 7BT -
Lorlin Test Systems
The 7BT Benchtop Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The 7BT automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results and uses a Windows 10 64-BIT Operating Systems and a USB 2.0 Interface.
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Howland & Lawrence Chamber Services
RF shield testing: IEEE-299, MIL-STD-285, NSA 65-6CTIA CATL certification testing: Probe symmetry and amplitude ripple measurements following Test Plan for Wireless Device Over-the-Air PerformanceAnechoic material test, inspection, remediation: VSWR, inverse spherical nearfield testing of installed material and NRL arch screening tests of individual absorber pieces We can also provide in-process testing of welded steel shielded enclosures with a test technique based on ASME BPVC vacuum box testing—confirm quality of RF welds before the shield envelope is complete. We developed this method for testing the Navy’s Advanced System Integration Lab (ASIL) chamber at Patuxent River, shaving weeks off the construction/testing schedule.
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Extech MN35 -
Extech Instruments Corporation
The MN35 is a convenient mini size multimeter with protective rubber holster and tilt stand. Manual ranging, measures AC and DC Voltage to 600V, Resistance with Continuity and Diode functions, DC Current to 10A, Temperature, and 9V/1.5V Battery test. Includes protective rubber holster, 9V battery, test leads and Type K thermocouple probe.
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TAC1000 -
Rhesca Co., Ltd.
For the measurement of tackiness (instantaneous adhesive strength) of various pastes and adhesive tapes, it is possible to quantitatively evaluate the data, which until now had large errors due to individual differences. First, press the measuring probe, which is controlled (approach speed, pressure force, pressure time, separation speed) against the sample, and measure the adhesive force in the process of separating. Measured data can be processed by a computer. With double temperature control (patented), the sample piece is preheated from the back side with a hot plate and the heated probe penetrates the measurement surface, making it possible to keep the set temperature and the temperature of the test surface to be evaluated constant. Since the pressurization time can be as short as 10msec, it is possible to measure the tackiness caused by momentary contact.
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Triplett Test Equipment & Tools
compact digital multimeter with a backlit LCD display. It offers a large variety of measurement features including AC/DC Voltage, DC Current, Resistance, Continuity, Diode Test, Transistor hFE, and Temperature. The rubberized boot provides impact and drop resistance in a sleek ergonomic design, and the user-friendly Auto Power Off feature helps maximizes battery life. The Model 1101-B is well suited for a variety of commercial and residential applications such as security, home theater, electrical, HVAC installations and more. Includes test leads with alligator clips, Type K bead probe and battery (9V).
